New TEM at CAB
CAB has received grants from the governmental research infrastructure roadmap, which allowed to invest in a state-of-the-art Scanning / Transmission Electron Microscope (TEM). The Talos system allows full control of the microscope by software; only the change of specimen is done manually. In addition to using conventional ultrathin sectioned or negative contrasted specimens, it enables three dimensional imaging via tomography. In scanning mode (STEM), the focused electron beam scans the specimen, which allows both bright field and darkfield imaging. This mode is of special importance for analytical imaging using the fitted EDS detector, where element-specific X-ray spectra can be acquired and quantified per pixel.
User operation of the system has started after the summer break.